Morphology of YSZ thin films on Ag substrate

College

College of Science

Department/Unit

Physics

Document Type

Article

Source Title

International Journal of Scientific & Engineering Research

Volume

3

Issue

2

First Page

1

Last Page

5

Publication Date

2-2012

Abstract

Different concentrations of yttria stabilized zirconia (YSZ) grown on silver (Si) substrate was investigated in this paper. Suspension containing 10wt%, 30wt% and 50wt% YSZ were fabricated using the spin coating technique on silver keeping all other parameters constant such as the coating parameters and sintering temperature. The surface morphology and thickness of the films were investigated using scanning electron microscopy (SEM). Results showed porous YSZ films which become less porous as the concentration of YSZ increases. The thickness of the films was also affected by the YSZ concentration. As the concentration increases, the thickness of the films also increases. The crystal structure of the fabricated films was also determined using X-ray Diffraction (XRD) and Raman Spectroscopy. Both techniques revealed a cubic fluorite structure independent of the concentration of YSZ.

html

Disciplines

Physics

Upload File

wf_no

This document is currently not available here.

Share

COinS