Report no. JKR-20-04-8DC0160
Document Type
Text Resource
Publication Date
12-2004
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Recommended Citation
Jordan, V., Guerrero, N., Sia, G., Avendano, M., Aquino, D., Vallejos, B., Isidro, R., & Macarubbo, R. M. (2004). Report no. JKR-20-04-8DC0160. Retrieved from https://animorepository.dlsu.edu.ph/faculty_research/8332
Disciplines
Operations Research, Systems Engineering and Industrial Engineering
Keywords
Semiconductors—Defects; Failure analysis (Engineering)
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