ANN diagnosis for defect detection and classification in two-layer printed circuit boards using supervised back-propagation algorithm
College
Gokongwei College of Engineering
Department/Unit
Electronics And Communications Engg
Document Type
Conference Proceeding
Source Title
Lecture Notes in Electrical Engineering
Volume
362
First Page
577
Last Page
593
Abstract
In this work, the proponent makes use of Artificial Neural Network (ANN) to visually inspect and classify the defect found in two-layer Printed Circuit Boards (PCBs). The proponent trained and tested the data for pattern recognition using C language. The supervised back-propagation learning algorithm was used for training and testing of PCB patterns. This learning algorithm is suitable for training multi-layered neural network and for generating the deltas of all output and hidden neurons. Considering that training and testing the data would only provide outputs with respect to generated weights, the proponent makes use of another program for defect detection. Excel VBA macro program was used for commonality testing of actual versus expected outputs. Also, it was used in making PCB defect detection possible by marking each defective unit. The proponent modeled a bare PCB circuit with 80 × 44 dimensions. The PCB board was further divided into 32 panel sides, each with 10 × 11 dimensions. There were five defective units modeled in the first layer and there were 14 classified defects used in the second layer. These data were trained and tested successfully, accurately and reliably using ANN. © Springer International Publishing Switzerland 2016.
html
Digitial Object Identifier (DOI)
10.1007/978-3-319-24584-3_50
Recommended Citation
Caldo, R. B. (2021). ANN diagnosis for defect detection and classification in two-layer printed circuit boards using supervised back-propagation algorithm. Lecture Notes in Electrical Engineering, 362, 577-593. https://doi.org/10.1007/978-3-319-24584-3_50
Disciplines
Electrical and Computer Engineering | Electrical and Electronics
Keywords
Pattern recognition systems; Printed circuits—Defects; Printed circuits—Inspection; Neural networks (Computer science)
Upload File
wf_no