Nanoscale contact charging of MoS2 by atomic force microscope

College

College of Science

Department/Unit

Physics

Document Type

Conference Proceeding

Source Title

Proceedings of the Samahang Pisika ng Pilipinas, 38th Samahang Pisika ng Pilipinas Physics Conference

Publication Date

10-2020

Abstract

Contact Electrification of MoS2 at nanometer level was demonstrated using a tapping mode Atomic Force Microscope or AFM. A highly doped n-type Si tip, d.c. biased from 0 to ±2V with a resonant frequency of 300kHz and a fixed amplitude set-point amplitude of 20nm, was used to generate contact electrification on the surface of 5mm x 3mm MoS2 sample. Using the Kelvin Probe Force Microscope or KPFM, the surface potential images were shown to have bipolar charging and the surface charge affinity is more influenced by the positive bias voltage

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Disciplines

Physical Sciences and Mathematics | Physics

Keywords

Molybdenum disulfide; Surface discharges (Electricity); Nanoelectronics; Atomic force microscopy

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