Measurement of operational amplifier voltage noise spectral density using FFT functions on CTS LCT40 low cost linear test system

Date of Publication

8-2006

Document Type

Practicum Paper

Degree Name

Master of Engineering major in Electronics and Communications Engineering

Subject Categories

Electrical and Electronics | Systems and Communications

College

Gokongwei College of Engineering

Department/Unit

Electronics and Communications Engineering

Thesis Adviser

Analene M. Nagayo

Defense Panel Chair

Enrique M. Manzano

Defense Panel Member

Edzel R. Lapira
Antonio S. Gonzalez, Jr.

Abstract/Summary

Amplifier noise is an important parameter because it dictates the level of accuracy of any electronic system. This paper will discuss the method of measuring operational amplifier voltage noise spectral density using the low frequency digitizer, low pass filter and FFT (fast Fourier transform) functions of CTS (Component Test Systems) LCT40 low cost linear tester. Performance/DUT (Device Under Test) board was designed to have a high noise gain and low input noise so that quantization noise introduce by the low frequency digitizer and programmable gain amplifier input noise can be neglected with insignificant measurement error. The test program was written to check the Performance/DUT board noise gain accuracy before digitizing DUT noise and computing the rms (root-mean-square) average FFT from 64 individual FFTs. Low noise amplifiers OP37 and OP77 were tested on SRS (Stanford Research Systems) SR760 FFT spectrum analyzer to serve as the reference. Finally, CTS LCT40 10Hz and 1kHz voltage noise spectral density measurement were verified to be accurate within ±2% (±0.2dB) to the reference.

Abstract Format

html

Language

English

Format

Electronic

Accession Number

CDTG006214

Shelf Location

Archives, The Learning Commons, 12F Henry Sy, Sr. Hall

Keywords

Amplifiers (Electronics)—Noise—Measurement

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10-1-2023

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