Microcontroller based robustness test device for microwave oven door system and interlocks at the Bureau of Product Standards Testing Center (BPSTC)
Date of Publication
2011
Document Type
Master's Thesis
Degree Name
Master of Engineering major in Electronics and Communications Engineering
College
Gokongwei College of Engineering
Department/Unit
Electronics and Communications Engineering
Abstract Format
html
Language
English
Format
Electronic
Accession Number
CDTG005052
Shelf Location
Archives, The Learning Commons, 12F Henry Sy Sr. Hall
Recommended Citation
Merin, J. (2011). Microcontroller based robustness test device for microwave oven door system and interlocks at the Bureau of Product Standards Testing Center (BPSTC). Retrieved from https://animorepository.dlsu.edu.ph/etd_masteral/4079
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