Implementation of core manufacturing test program for memory SPI devices using multiple tester platform system
Date of Publication
2009
Document Type
Master's Thesis
Degree Name
Master of Engineering major in Electronics and Communications Engineering
College
Gokongwei College of Engineering
Department/Unit
Electronics and Communications Engineering
Thesis Adviser
Cesar A. Llorente
Abstract Format
html
Language
English
Format
Electronic
Accession Number
CDTG006227
Shelf Location
Archives, The Learning Commons, 12F Henry Sy Sr. Hall
Physical Description
1 computer optical disc ; 4 3/4 in.
Recommended Citation
David, E. R. (2009). Implementation of core manufacturing test program for memory SPI devices using multiple tester platform system. Retrieved from https://animorepository.dlsu.edu.ph/etd_masteral/3884
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