A system study on the high volume low mix (HVLM) manufacturing operation of alarm detectors of Integrated Micro-Electronics, Inc.

Date of Publication

2017

Document Type

Bachelor's Thesis

Degree Name

Bachelor of Science in Industrial Engineering

Subject Categories

Engineering

College

Gokongwei College of Engineering

Department/Unit

Industrial and Systems Engineering

Thesis Adviser

Richard C. Li

Defense Panel Chair

Willy F. Zalatar

Defense Panel Member



Anna Bella Siriban Manalang


Abstract/Summary

A system study was conducted on Integrated Micro-Electronics, Inc. (IMI) on the alarm detector assembly at Laguna Technopark Plant, specifically, in Building D where the RISCO line is located. With the use of the WOT-SURG analysis, the problem of rejected units exceeding the allowable scrap cost of USD3,067.60 by USD5,251.27 was determined for January 2015-December 2015.

With the use of the why-why diagram, the reject contribution of each reject type has been identified then, the irrelevant causes were disregarded. The final root causes include: failure to apply hear to pad, solder flux was melted at a temperature higher than the required (solder bridging). The supplier did not conform raw materials to the company standards on the printed wired board and plastic casings, stations not positioned sequentially to each other, PCB has multiple holes that confuses operators, and finally, electrical components have similar features that confuses operators. The proposed system for these was then identified through the KTDA. These are composed of the use of a microfiber anti-static brush, calibration of the solder wave machine every month, implementation of a spare request form, adding acrylic shelves, providing visual aid for the correct orientation of electrical components, and acquiring electrical kit boxes for every product in the assembly line.

Through the proposed solutions, the company would eliminate around 8,287 rejected units that of which incurred total annual benefit amounting to USD77,722.85 for the first year. Through sufficient data form the annual benefits computed, the implementation of this proposed system led to an NPV of approximately USD11,918.29, and a payback period of about 9 days. Finally, by simulating the present and proposed system, the researchers concluded that there would be a 74.01 percent decrease in the average of the rejected units after the implementation.

Abstract Format

html

Language

English

Format

Print

Accession Number

TU17383

Shelf Location

Archives, The Learning Commons, 12F, Henry Sy Sr. Hall

Physical Description

xv, 283 leaves : illustrations (some color) ; 29 cm.

Keywords

Detectors; Manufacturing processes; Production engineering; Integrated Micro-Electronics, Inc

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