Characterization of spin coated YSZ thin films by Raman spectroscopy, x-ray diffraction and scanning electron microscopy
Date of Publication
2010
Document Type
Bachelor's Thesis
Degree Name
Bachelor of Science in Physics with Specialization in Materials Science
Subject Categories
Physics
College
College of Science
Department/Unit
Physics
Thesis Adviser
Michelle T. Natividad
Defense Panel Chair
Nelson B. Arboleda
Defense Panel Member
Raymund Bolalin
Voltaire Mistades
Abstract/Summary
Yttria Stabilized Zirconia (YSZ) thin films (<10 >um) were fabricated by spin coating technique on three different substrates namely, silicon (Si), silica (SiO2) and steel (Fe/ Cr18 Ni10). Parameters such asd sintering temperature, thickness of the YSZ films, kind of substrates and concentration ratio of YSZ powder to solvent were varied accordingly. The effects of these variations were investigated and discussed. Using X-ray Diffraction and Raman Spectroscopy, the crystal structure of the samples were determined. The 8-YSZ thin films have cubic fluorite structure. The X-ray diffraction patterns were in agreement with the samples Raman spectra. The X-ray diffraction patterns were in agreement with the samples Raman spectra. In the case of the 30ysc: 70ethanol YSZ thin film on steel substrate, the Raman and XRD peaks shifted because of the stress-strain interaction between the steel and the YSZ thin film. Pores were evident on single coated substrates but were minimized using higher YSZ concentration.
Abstract Format
html
Language
English
Format
Accession Number
TU18097
Shelf Location
Archives, The Learning Commons, 12F, Henry Sy Sr. Hall
Physical Description
81, 5 leaves ; illustrations (some colored) ; 28 cm.
Recommended Citation
Mendiola, S. (2010). Characterization of spin coated YSZ thin films by Raman spectroscopy, x-ray diffraction and scanning electron microscopy. Retrieved from https://animorepository.dlsu.edu.ph/etd_bachelors/2551
