Fabrication and characterization of spin-coated YSZ thin films

Date of Publication

2010

Document Type

Bachelor's Thesis

Degree Name

Bachelor of Science in Physics with Specialization in Materials Science

Subject Categories

Physics

College

College of Science

Department/Unit

Physics

Thesis Adviser

Michelle T. Natividad

Defense Panel Chair

Edgar Vallar

Defense Panel Member

Melanie David
Raphael C. Bongay

Abstract/Summary

The effect of using different concentrations of yttria stabilized zirconia (YSZ) and different substrates on the fabrication of YSZ films was investigated in this paper. Suspension containing 10wt%, 30wt% and 50wt% YSZ were fabricated using the spin coating technique on silicon, silica and silver substrates keeping all other parameters constant such as the coating parameters and sintering temperature. The surface morphology and thickness of the films were investigated using scanning electron microscopy (SEM). Results showed porous YSZ films which become less porous as the concentration of YSZ increases. The thickness of the films was also affected by the YSZ concentration. As the concentration increases, the thickness of the films also increases. The continuity and the uniformity of the films, on the other hand, depend on the substrate used. A discontinuous film with 10wt% YSZ was produced on silver because of its severe roughness as compared to silicon and silica. The crystal structure of the fabricated films was also determined using X-ray Diffraction (XRD) and Raman Spectroscopy. Both techniques revealed a cubic fluorite structure independent of the concentration of YSZ and the type of substrate used.

Abstract Format

html

Language

English

Format

Print

Accession Number

TU16791; CDTU016791

Shelf Location

Archives, The Learning Commons, 12F, Henry Sy Sr. Hall

Upload Full Text

wf_no

This document is currently not available here.

Share

COinS