Diode and FET defect localization using wavelet transform

Author

Enrique S. Flores
Ysmael Carlos B. Puzon
Ray Marvin C. Santiago
Joseph Patrick M. Valdez

Date of Publication

2005

Document Type

Bachelor's Thesis

Degree Name

Bachelor of Science in Electronics and Communications Engineering

College

Gokongwei College of Engineering

Department/Unit

Electronics and Communications Engineering

Abstract Format

html

Language

English

Format

Print

Accession Number

TU12429

Shelf Location

Archives, The Learning Commons, 12F, Henry Sy Sr. Hall

Physical Description

175 leaves ; Computer print-out + 1 computer optical disk 4 3/4 in.

Recommended Citation

Flores, E. S., Puzon, Y. B., Santiago, R. C., & Valdez, J. M. (2005). Diode and FET defect localization using wavelet transform. Retrieved from https://animorepository.dlsu.edu.ph/etd_bachelors/12764