Title

Microcontroller based robustness test device for microwave oven door system and interlocks at the Bureau of Product Standards Testing Center (BPSTC)

Date of Publication

2011

Document Type

Master's Thesis

Degree Name

Master of Engineering major in Electronics and Communications Engineering

College

Gokongwei College of Engineering

Department/Unit

Electronics And Communications Engg

Abstract Format

html

Language

English

Format

Electronic

Accession Number

CDTG005052

Shelf Location

Archives, The Learning Commons, 12F Henry Sy Sr. Hall

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