Title

Electrical characterization and resolution of device failures on 90 nanometer phase change memory technology of numonyx

Date of Publication

2010

Document Type

Master's Thesis

Degree Name

Master of Engineering major in Electronics and Communications Engineering

College

Gokongwei College of Engineering

Department/Unit

Electronics And Communications Engg

Thesis Adviser

Aaron Don M. Africa

Abstract Format

html

Language

English

Format

Electronic

Accession Number

CDTG006302

Shelf Location

Archives, The Learning Commons, 12F Henry Sy Sr. Hall

Physical Description

1 computer optical disc ; 4 3/4 in.

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