Electrical characterization and resolution of device failures on 90 nanometer phase change memory technology of numonyx
Date of Publication
2010
Document Type
Master's Thesis
Degree Name
Master of Engineering major in Electronics and Communications Engineering
College
Gokongwei College of Engineering
Department/Unit
Electronics and Communications Engineering
Thesis Adviser
Aaron Don M. Africa
Abstract Format
html
Language
English
Format
Electronic
Accession Number
CDTG006302
Shelf Location
Archives, The Learning Commons, 12F Henry Sy Sr. Hall
Physical Description
1 computer optical disc ; 4 3/4 in.
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Recommended Citation
Quiray, J. F. (2010). Electrical characterization and resolution of device failures on 90 nanometer phase change memory technology of numonyx. Retrieved from https://animorepository.dlsu.edu.ph/etd_masteral/3896
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